TECHNOFOUR

PARAS-EX

PARAS-EX

PARAS-EX

PARAS presents signals in easy to understand C-Scans

Eddy Current Probe Array Test System for inspection of Bars, Strips, plates and Tubes. The technique is faster and more reliable as no moving parts are needed.

Overview

Paras-EX is a configurable probe array system for detection of flaws in metal surfaces.  An array of several individual eddy current probes is arranged in close proximity of material to be tested.  The probe elements are sequentially energized.  While one transmits, two or three nearby elements receive signals.  Then the roles are reversed in a cyclic manner.  All the data is processed and displayed in a C-scan image.  Test automation is available as always.

Applications

  • Ideal for detection of Transverse as well as Longitudinal defects
  • Adaptable to non-round cross sections or flat surfaces
  • Arrays can be shaped to conform to irregular cross sections like rails

Features

  • Up to 512 channels
  • Much faster than rotating probes
  • No moving parts
  • 3D representation of defects
  • Variable test frequency
  • Four evaluation modes
  • User-configurable displays
  • Paint markers and encoders
  • Automatic setup
  • Windows operating system
  • Extensive data logging and reporting, e-mail reports
  • TCP/IP servers over Ethernet
  • Mechanical handling systems
    with sorting automation
  • Saturation and Demagnetization
    systems

Technical Data

Frequency Range              30 KHz to 1 MHz
Signal Gain                        0 dB to 80 dB
Phase Rotation                  0 to 359 degrees in 1 degree steps
Number of channels         Up to 512
Resolution                         14 bits
Thresholds                         Sector and Amplitude
Data Presentation             3D C-scans, X-Y, Strip chart
Data Storage                      SSD, USB
Connectivity                      TCP/IP over Ethernet
Operating System             Windows Professional
Sensors                              Send-Receive

Features

  • Up to 512 channels
  • Much faster than rotating probes
  • No moving parts
  • 3D representation of defects
  • Variable test frequency
  • Four evaluation modes
  • User-configurable displays
  • Paint markers and encoders
  • Automatic setup
  • Windows operating system
  • Extensive data logging and reporting, e-mail reports
  • TCP/IP servers over Ethernet
  • Mechanical handling systems
    with sorting automation
  • Saturation and Demagnetization
    systems

Technical Data

Frequency Range: 30 KHz to 1 MHz
Signal Gain: 0 dB to 80 dB
Phase Rotation: 0 to 359 degrees in 1 degree steps
Number of channels: Up to 512
Resolution: 14 bits
Thresholds: Sector and Amplitude
Data Presentation: 3D C-scans, X-Y, Strip chart
Data Storage: SSD, USB
Connectivity: TCP/IP over Ethernet
Operating System: Windows Professional
Sensors: Send-Receive