TECHNOFOUR

Defectoscope-LX

Defectoscope-LX

Defectoscope-LX

Flawmark-SPX is an entry level system for inspection of seamless or welded tubes.

Entry level rotating component eddy current system for detection of fine cracks on roto-symmetrical automotive and other precision components

Overview

Technofour Defectoscope-LX Test System detects surface-breaking cracks on finished roto-symmetrical components such as ball pins, gudgeon pins, piston rods, bearing races, rollers, cylinder liners, gear blanks, ammunition shells etc in production environment or at inward quality inspection.

The component is rotated while one or more probes scan the surface helically. Either the component advances past stationary probes as it rotates, or the probes themselves move over the component’s surface.

 

Applications

  • Defectoscope-LX is ideally suited for detection of fine surface cracks on precision components such as those used in automotive industries, aerospace, defence or other demanding applications.
  • Typically used for automobile components, the system can detect flaws as fine as 50 microns on polished surfaces.
  • Complete automation support is provided along with several kinds of custom-built mechanisms for scanning and sorting to maximize productivity.

Features

  • Can detect axial as well as circumferential defects
  • Multi-channel capability for testing complex parts
  • Single probe for scanning various surfaces
  • Capable of end-area inspection in OCTG pipes
  • Test frequency in steps
  • Independent High-pass and Low-pass filter
  • Customized mechanisms for test automation
  • Four thresholds including sector gate
  • Three evaluation modes
  • No magnetization or demagnetization required
  • 100% quality inspection

Technical Data

Frequency Range     200KHz to 1.5MHz in steps    
Max probes               1               
Operating System    Windows 32-bit    
Data storage             Hard disk, USB flash drive              
Signal Gain               0 dB to 88 dB in steps of 0.1 dB              
Phase                        0 deg to 359 deg in steps of 1 deg                    
Thresholds               Upper, Lower, Third: 10% to 100%
                                   Sector 20° to 80°       
Evaluation modes    Phase sensitive, Amplitude, Sector     
Filters                        Independently adjustable
                                   High Pass: 1 Hz to 2000 Hz
                                   Low Pass: 2 Hz to 2550 Hz
Automation              
Independently adjustable
                                   High Pass: 1 Hz to 2000 Hz
                                   Low Pass: 2 Hz to 2550 Hz

Features

  • Can detect axial as well as circumferential defects
  • Multi-channel capability for testing complex parts
  • Single probe for scanning various surfaces
  • Capable of end-area inspection in OCTG pipes
  • Test frequency in steps
  • Independent High-pass and Low-pass filter
  • Customized mechanisms for test automation
  • Four thresholds including sector gate
  • Three evaluation modes
  • No magnetization or demagnetization required
  • 100% quality inspection

Technical Data

Frequency Range: 200KHz to 1.5MHz in steps
Max probes: 1               
Operating System: Windows 32-bit    
Data storage: Hard disk, USB flash drive
Signal Gain: 0 dB to 88 dB in steps of 0.1 dB              
Phase: 0 deg to 359 deg in steps of 1 deg                    
Thresholds: Upper, Lower Ι Third: 10% to 100% Ι
Sector 20° to 80°       
Evaluation modes: Phase sensitive, Amplitude, Sector     
Filters: Independently adjustable Ι High Pass: 1 Hz to 2000 Hz Ι Low Pass: 2 Hz to 2550 Hz
Automation:
Independently adjustable Ι
High Pass: 1 Hz to 2000 Hz Ι Low Pass: 2 Hz to 2550 Hz

A Defectoscope probe scans the surface of a rotating component
Operating principle
Gate sorter automatically sorts components into three bins using two actuated levers
Ballpin scanner and sorter